LIME, FRANÇOIS GILBERT MARIE
iMarina ID: 04-322078Departament
Eng. Electrònica, Elèctrica i Automàtica. Universitat Rovira i Virgili. Tarragona
Grup
NanoElectronic and PHOtonic Systems (NEPHOS) (2017 SGR 01527). Universitat Rovira i Virgili. Tarragona
Codis d'identificació
Cronologia
setembre de 2016
Professorat agregat
Universitat Rovira i Virgili. Eng. Electrònica, Elèctrica i Automàtica
2016 -
setembre de 2016
Professorat Agregat. Eng. Electrònica, Elèctrica i Automàtica
Universitat Rovira i Virgili
2016 - 2020
desembre de 2013
Professorat Agregat Interí. Eng. Electrònica, Elèctrica i Automàtica
Universitat Rovira i Virgili
2013 - 2016
desembre de 2008
Personal Investigador Ramon y Cajal. Eng. Electrònica, Elèctrica i Automàtica
Universitat Rovira i Virgili
2008 - 2013
gener de 2006
Investigador amb experiència. Eng. Electrònica, Elèctrica i Automàtica
Universitat Rovira i Virgili
2006 - 2006
Reconeixements Investigació
Sexennis
1
Any últim Sexenni:
Reconeixements Docents
Transferència
Temàtiques més freqüents
Temáticas
Projectes participats
Direcció y participació en projectes
IP
NO IP
Grups, xarxes
NanoElectronic and PHOtonic Systems (NEPHOS) (2017 SGR 01527)
Activitat docent
Tesi Dirigides
2
Centres
Universitat Rovira i Virgili
Assignatura/Curs
Publicacions en Altmetrics
| 2020 | Direct Source-to-Drain Tunneling Current in Ultra-Short Channel DG MOSFETs by Wa... | |
| 2019 | Evaluation of Static/Transient Performance of TFET Inverter Regarding Device Par... | |
| 2019 | Equivalent Length Concept for Compact Modeling of Short-Channel GAA and DG MOSFE... | |
| 2019 | Analytical modeling of capacitances in tunnel-FETs including the effect of Schot... | |
| 2019 | A Complete Charge-Based Capacitance Model for IGZO TFTs | |
| 2018 | Effect of Schottky barrier contacts on measured capacitances in tunnel-FETs | |
| 2017 | Non-iterative NEGF based model for band-to-band tunneling current in DG TFETs | |
| 2017 | A compact explicit DC model for short channel Gate-All-Around junctionless MOSFE... | |
| 2017 | Crystalline-like temperature dependence of the electrical characteristics in amo... | |
| 2017 | DC/AC Compact Modeling of TFETs for Circuit Simulation of Logic Cells Based on a... | |
| 2017 | Compact modeling of intrinsic capacitances in Double-Gate Tunnel-FETs | |
| 2017 | A quantum wave based compact modeling approach for the current in ultra-short DG... | |
| 2016 | A complete Verilog-A Gate-All-Around junctionless MOSFET model | |
| 2016 | Modeling approach for rapid NEGF-based simulation of ballistic current in ultra-... | |
| 2015 | A complete and Verilog-A compatible Gate-All-Around long-channel junctionless MO... | |
| 2015 | Experimentally verified drain-current model for variable barrier transistor | |
| 2015 | A simple analytical Variable Barrier Transistor drain current model | |
| 2014 | Compact modeling of double and Tri-Gate MOSFETs | |
| 2014 | A compact explicit model for long-channel gate-all-around junctionless MOSFETs. ... | |
| 2014 | A compact explicit model for long-channel gate-all-around junctionless MOSFETs. ... | |
| 2013 | Compact Models for Advanced CMOS Devices | |
| 2013 | A simple compact model for the junctionless Variable Barrier Transistor (VBT) | |
| 2013 | Modeling of low frequency noise in FD SOI MOSFETs | |
| 2013 | Compact modeling of double and tri-gate MOSFETs | |
| 2013 | A simple compact model for long-channel junctionless Double Gate MOSFETs | |
| 2012 | Temperature dependence of terahertz radiation detection by field effect transist... | |
| 2012 | Gate leakage current partitioning in nanoscale double gate MOSFETs, using compac... | |
| 2012 | Temperature enhancement of terahertz responsivity of plasma field effect transis... | |
| 2011 | Low frequency noise modeling of SOI MOSFETs using Green's function approach | |
| 2011 | 3D analytical modelling of subthreshold characteristics in vertical Multiple-gat... | |
| 2011 | Study of potential high-k dielectric for UTB SOI MOSFETs using analytical modeli... | |
| 2011 | A physical compact DC drain current model for long-channel undoped ultra-thin bo... | |
| 2011 | Analytical modeling of direct tunneling current through gate stacks for the dete... | |
| 2011 | A simple analytical and explicit compact model for the drain current of UTB SOI ... | |
| 2011 | Analytical modelling of Multiple-gate MOSFETs | |
| 2011 | A surface potential based compact model for lightly doped FD SOI MOSFETs with ul... | |
| 2011 | New numerical low frequency noise model for front and buried oxide trap density ... | |
| 2011 | Compact analytical modeling of the gate leakage current partitioning for Double ... | |
| 2010 | 3D analytical modelling of subthreshold characteristics in Pi-gate FinFET transi... | |
| 2010 | Analytical modeling of the gate tunneling leakage for the determination of adequ... | |
| 2010 | Parasitic Back-Inferface Conduction in Planar and Triple-Gate SOI Transistors | |
| 2010 | An innovative NEMS pressure sensor approach based on heterostructure nanowire | |
| 2009 | Analytical modeling of the gate tunneling leakage for the determination of adequ... | |
| 2009 | 2D compact modeling of the threshold voltage in triple- and Pi-gate transistors | |
| 2009 | Finite elements study of high mechanical stress in nanostructures for innovative... | |
| 2008 | A quasi-two-dimensional compact drain-current model for undoped symmetric double... | |
| 2006 | Electrical studies of semiconductor-dielectric interfaces | |
| 2006 | Low temperature characterization of effective mobility in uniaxiallyand biaxiall... | |
| 2005 | Experimental and comparative investigation of low and high field transport in su... | |
| 2005 | Low temperature characterization of effective mobility in uniaxially and biaxial... | |
| 2003 | Characterization of effective mobility by split C(V) technique in N-MOSFETs with... | |
| 2003 | Carrier mobility in advanced CMOS devices with metal gate and HfO2 gate dielectr... | |
| 2003 | New approach for the gate current source-drain partition modeling in advanced MO... | |
| 2003 | Charge trapping in SiO2/HfO2/TiN gate stack | |
| 2003 | Metal gate and high-k integration for advanced CMOS devices (invited paper) | |
| 2003 | Investigation of electron and hole mobilities in MOSFETs with TiN/HfO2/SiO2 gate... | |
| 2001 | Stress induced leakage current at low field in ultra thin oxides | |
| 2001 | Impact of gate tunneling leakage on the operation of NMOS transistors with ultra... |
Col·laboracions institucionals darrers 5 anys
